{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T13:58:08Z","timestamp":1725631088695},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,2]]},"DOI":"10.1109\/isscc.2008.4523218","type":"proceedings-article","created":{"date-parts":[[2008,5,21]],"date-time":"2008-05-21T15:39:02Z","timestamp":1211384342000},"page":"384-622","source":"Crossref","is-referenced-by-count":7,"title":["65nm Low-Power High-Density SRAM Operable at 1.0V under 3\u03c3 Systematic Variation Using Separate V<sub>th<\/sub> Monitoring and Body Bias for NMOS and PMOS"],"prefix":"10.1109","author":[{"given":"Masanao","family":"Yamaoka","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Noriaki","family":"Maeda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yasuhisa","family":"Shimazaki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kenichi","family":"Osada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.838014"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373426"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705345"}],"event":{"name":"2008 IEEE International Solid-State Circuits Conference","start":{"date-parts":[[2008,2,3]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2008,2,7]]}},"container-title":["2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4497158\/4523032\/04523218.pdf?arnumber=4523218","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,4]],"date-time":"2021-06-04T16:28:06Z","timestamp":1622824086000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4523218\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,2]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/isscc.2008.4523218","relation":{},"subject":[],"published":{"date-parts":[[2008,2]]}}}