{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T10:36:57Z","timestamp":1761561417237},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,2]]},"DOI":"10.1109\/isscc.2010.5433990","type":"proceedings-article","created":{"date-parts":[[2010,3,24]],"date-time":"2010-03-24T10:35:14Z","timestamp":1269426914000},"page":"190-191","source":"Crossref","is-referenced-by-count":8,"title":["Early detection of oxide breakdown through in situ degradation sensing"],"prefix":"10.1109","author":[{"given":"Prashant","family":"Singh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhiyoong","family":"Foo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Wieckowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Scott","family":"Hanson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matt","family":"Fojtik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Blaauw","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dennis","family":"Sylvester","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2008.4672036"},{"key":"ref3","first-page":"410","article-title":"Compact In-Situ Sensors for Monitoring Negative-Bias-Temperature-Instability Effect and Oxide Degradation","author":"karl","year":"2008","journal-title":"ISSCC Tech Digest"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523291"},{"key":"ref5","first-page":"398","article-title":"A distributed critical-path timing monitor for a 65 nm highperformance microprocessor","author":"drake","year":"2007","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197713"},{"key":"ref7","first-page":"256","article-title":"A sub 1W to 2W low power IA processor for mobile internet devices and ultra-mobile PCs in 45nm high-k metal gate CMOS","author":"gerosa","year":"2008","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.915477"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICMEL.2006.1650900"}],"event":{"name":"2010 IEEE International Solid- State Circuits Conference - (ISSCC)","start":{"date-parts":[[2010,2,7]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2010,2,11]]}},"container-title":["2010 IEEE International Solid-State Circuits Conference - (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5428240\/5433812\/05433990.pdf?arnumber=5433990","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T15:27:38Z","timestamp":1489850858000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5433990\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,2]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isscc.2010.5433990","relation":{},"subject":[],"published":{"date-parts":[[2010,2]]}}}