{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T11:29:24Z","timestamp":1768822164296,"version":"3.49.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,2]]},"DOI":"10.1109\/isscc.2010.5434042","type":"proceedings-article","created":{"date-parts":[[2010,3,24]],"date-time":"2010-03-24T14:35:14Z","timestamp":1269441314000},"page":"74-75","source":"Crossref","is-referenced-by-count":0,"title":["A thermal-diffusivity-based frequency reference in standard CMOS with an absolute inaccuracy of ±0.1% from −55°C to 125°C"],"prefix":"10.1109","author":[{"given":"Mahdi","family":"Kashmiri","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michiel","family":"Pertijs","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kofi","family":"Makinwa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2020248"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.883337"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.858476"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884865"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2009.5326001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2021914"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.863149"}],"event":{"name":"2010 IEEE International Solid- State Circuits Conference - (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2010,2,7]]},"end":{"date-parts":[[2010,2,11]]}},"container-title":["2010 IEEE International Solid-State Circuits Conference - (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5428240\/5433812\/05434042.pdf?arnumber=5434042","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T19:11:49Z","timestamp":1489864309000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5434042\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,2]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/isscc.2010.5434042","relation":{},"subject":[],"published":{"date-parts":[[2010,2]]}}}