{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:26:07Z","timestamp":1772119567381,"version":"3.50.1"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,2]]},"DOI":"10.1109\/isscc.2011.5746316","type":"proceedings-article","created":{"date-parts":[[2011,4,8]],"date-time":"2011-04-08T19:44:40Z","timestamp":1302291880000},"page":"274-276","source":"Crossref","is-referenced-by-count":56,"title":["A side-channel and fault-attack resistant AES circuit working on duplicated complemented values"],"prefix":"10.1109","author":[{"given":"Marion","family":"Doulcier-Verdier","sequence":"first","affiliation":[]},{"given":"Jean-Max","family":"Dutertre","sequence":"additional","affiliation":[]},{"given":"Jacques","family":"Fournier","sequence":"additional","affiliation":[]},{"given":"Jean-Baptiste","family":"Rigaud","sequence":"additional","affiliation":[]},{"given":"Bruno","family":"Robisson","sequence":"additional","affiliation":[]},{"given":"Assia","family":"Tria","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"Announcing the Advanced Encryption Standard (AES)","year":"2001","journal-title":"Federal Information Processing Standards Publication"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2009.4977309"},{"key":"ref6","first-page":"78","article-title":"Smartly analyzing the simplicity and the power of Simple Power Analysis on smartcards","volume":"1965","author":"mayer-sommer","year":"2000","journal-title":"Proc CHES 2000"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-ifs:20060163"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"513","DOI":"10.1007\/BFb0052259","article-title":"Differential fault analysis of secret key cryptosystems","author":"biham","year":"1997","journal-title":"Proceedings of Crypto'97"},{"key":"ref1","first-page":"16","article-title":"Correlation Power Analysis with a leakage model","volume":"3156","author":"brier","year":"2004","journal-title":"The Proceedings of CHES 2004"}],"event":{"name":"2011 IEEE International Solid- State Circuits Conference - (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2011,2,20]]},"end":{"date-parts":[[2011,2,24]]}},"container-title":["2011 IEEE International Solid-State Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5740653\/5746170\/05746316.pdf?arnumber=5746316","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T18:18:40Z","timestamp":1497896320000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5746316\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,2]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isscc.2011.5746316","relation":{},"subject":[],"published":{"date-parts":[[2011,2]]}}}