{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T07:03:22Z","timestamp":1729667002672,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,2]]},"DOI":"10.1109\/isscc.2012.6176979","type":"proceedings-article","created":{"date-parts":[[2012,4,5]],"date-time":"2012-04-05T17:40:15Z","timestamp":1333647615000},"page":"210-212","source":"Crossref","is-referenced-by-count":28,"title":["Ratiometric BJT-based thermal sensor in 32nm and 22nm technologies"],"prefix":"10.1109","author":[{"given":"Joseph","family":"Shor","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kosta","family":"Luria","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dror","family":"Zilberman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"3621","DOI":"10.1109\/JSSC.2009.2035553","article-title":"A 1.05V 1.6mW 0.45\ufffdC 3C-Resolution Sigma Delta-Based Temperature Sensor with Parasitic-Resistance Compensation in 32nm CMOS","volume":"44","author":"li","year":"2009","journal-title":"IEEE J Solid-State Circuits"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2144290"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2076610"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/4.760378"},{"key":"5","first-page":"264","article-title":"A Fully Integrated Multi-CPU, GPU and Memory Controller 32nm Processor","author":"yuffe","year":"2011","journal-title":"ISSCC Dig Tech Papers"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537829"}],"event":{"name":"2012 IEEE International Solid- State Circuits Conference - (ISSCC)","start":{"date-parts":[[2012,2,19]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2012,2,23]]}},"container-title":["2012 IEEE International Solid-State Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171933\/6176863\/06176979.pdf?arnumber=6176979","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T16:57:07Z","timestamp":1497977827000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176979\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,2]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isscc.2012.6176979","relation":{},"subject":[],"published":{"date-parts":[[2012,2]]}}}