{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:53:54Z","timestamp":1725537234623},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,2]]},"DOI":"10.1109\/isscc.2013.6487603","type":"proceedings-article","created":{"date-parts":[[2013,4,5]],"date-time":"2013-04-05T20:58:31Z","timestamp":1365195511000},"page":"506-507","source":"Crossref","is-referenced-by-count":0,"title":["F4: Scientific imaging"],"prefix":"10.1109","author":[{"given":"M.","family":"Ikeda","sequence":"first","affiliation":[]},{"given":"E.","family":"Afshari","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Oike","sequence":"additional","affiliation":[]},{"given":"D.","family":"Ruffieux","sequence":"additional","affiliation":[]},{"given":"J.","family":"Solhusvik","sequence":"additional","affiliation":[]},{"given":"A.","family":"Theuwissen","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2013 IEEE International Solid-State Circuits Conference (ISSCC 2013)","start":{"date-parts":[[2013,2,17]]},"location":"San Francisco, CA","end":{"date-parts":[[2013,2,21]]}},"container-title":["2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6480926\/6487590\/06487603.pdf?arnumber=6487603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T18:03:30Z","timestamp":1490205810000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6487603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,2]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/isscc.2013.6487603","relation":{},"subject":[],"published":{"date-parts":[[2013,2]]}}}