{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T02:26:27Z","timestamp":1725675987978},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,1]]},"DOI":"10.1109\/isscc.2016.7417902","type":"proceedings-article","created":{"date-parts":[[2016,3,25]],"date-time":"2016-03-25T16:32:21Z","timestamp":1458923541000},"page":"52-54","source":"Crossref","is-referenced-by-count":7,"title":["2.9 A 2GHz 244fs-resolution 1.2ps-Peak-INL edge-interpolator-based digital-to-time converter in 28nm CMOS"],"prefix":"10.1109","author":[{"given":"Sebastian","family":"Sievert","sequence":"first","affiliation":[]},{"given":"Ofir","family":"Degani","sequence":"additional","affiliation":[]},{"given":"Assaf","family":"Ben-Bassat","sequence":"additional","affiliation":[]},{"given":"Rotem","family":"Banin","sequence":"additional","affiliation":[]},{"given":"Ashoke","family":"Ravi","sequence":"additional","affiliation":[]},{"given":"Bernd-Ulrich","family":"Klepser","sequence":"additional","affiliation":[]},{"given":"Zdravko","family":"Boos","sequence":"additional","affiliation":[]},{"given":"Doris","family":"Schmitt-Landsiedel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2014.6942026"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2414421"},{"article-title":"Precision CMOS Receivers for VLSI Testing Applications","year":"2001","author":"weinlader","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2216671"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.914287"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2274892"}],"event":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","start":{"date-parts":[[2016,1,31]]},"location":"San Francisco, CA","end":{"date-parts":[[2016,2,4]]}},"container-title":["2016 IEEE International Solid-State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7405163\/7417881\/07417902.pdf?arnumber=7417902","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T19:58:44Z","timestamp":1475179124000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7417902\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,1]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isscc.2016.7417902","relation":{},"subject":[],"published":{"date-parts":[[2016,1]]}}}