{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T14:13:47Z","timestamp":1772115227481,"version":"3.50.1"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,1]]},"DOI":"10.1109\/isscc.2016.7417955","type":"proceedings-article","created":{"date-parts":[[2016,3,25]],"date-time":"2016-03-25T20:32:21Z","timestamp":1458937941000},"page":"158-160","source":"Crossref","is-referenced-by-count":67,"title":["8.7 Physically unclonable function for secure key generation with a key error rate of 2E-38 in 45nm smart-card chips"],"prefix":"10.1109","author":[{"given":"Bohdan","family":"Karpinskyy","sequence":"first","affiliation":[{"name":"Samsung Electronics, Hwaseong, Korea"}]},{"given":"Yongki","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Korea"}]},{"given":"Yunhyeok","family":"Choi","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Korea"}]},{"given":"Yongsoo","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Korea"}]},{"given":"Mijung","family":"Noh","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Korea"}]},{"given":"Sanghyun","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Korea"}]}],"member":"263","reference":[{"key":"ref4","first-page":"256","article-title":"15fJ\/b Static Physically Unclonable Functions for Secure Chip Identification with <2% Native Bit Instability and 140x Inter\/Intra PUF Hamming Distance Separation in 65nm","author":"alvarez","year":"2015","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757433"},{"key":"ref6","first-page":"58","article-title":"Design and Implementation of PUF-Based &#x201C;Unclonable&#x201D; RFID ICs for Anti-Counterfeiting and Security Applications","author":"devadas","year":"2008","journal-title":"Proc IEEE Int Conf RFID"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2012.6341361"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-5040-5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2000.839821"}],"event":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2016,1,31]]},"end":{"date-parts":[[2016,2,4]]}},"container-title":["2016 IEEE International Solid-State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7405163\/7417881\/07417955.pdf?arnumber=7417955","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T18:50:23Z","timestamp":1731523823000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7417955\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,1]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isscc.2016.7417955","relation":{},"subject":[],"published":{"date-parts":[[2016,1]]}}}