{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T23:46:59Z","timestamp":1780444019331,"version":"3.54.1"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,1]]},"DOI":"10.1109\/isscc.2016.7418023","type":"proceedings-article","created":{"date-parts":[[2016,3,25]],"date-time":"2016-03-25T16:32:21Z","timestamp":1458923541000},"page":"294-295","source":"Crossref","is-referenced-by-count":14,"title":["16.4 A flexible EEG acquisition and biomarker extraction system based on thin-film electronics"],"prefix":"10.1109","author":[{"given":"Tiffany","family":"Moy","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liechao","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Warren","family":"Rieutort-Louis","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sigurd","family":"Wagner","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"James C.","family":"Sturm","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Naveen","family":"Verma","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DRC.2014.6872402"},{"key":"ref3","article-title":"Representative Flicker Noise Measurements for Low-Temperature Amorphous Silicon, Organic, and Zinc Oxide Thin-film Transistors","author":"rieutort-louis","year":"2015","journal-title":"Proc of the International Thin-Film Transistors Conf"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2301733"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DCAS.2006.321036"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2014.2314135"},{"key":"ref1","year":"0","journal-title":"Inc StatNet"}],"event":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2016,1,31]]},"end":{"date-parts":[[2016,2,4]]}},"container-title":["2016 IEEE International Solid-State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7405163\/7417881\/7418023.pdf?arnumber=7418023","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T20:06:58Z","timestamp":1475179618000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7418023\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,1]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isscc.2016.7418023","relation":{},"subject":[],"published":{"date-parts":[[2016,1]]}}}