{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T14:52:31Z","timestamp":1725720751046},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2017,2,1]],"date-time":"2017-02-01T00:00:00Z","timestamp":1485907200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2017,2,1]],"date-time":"2017-02-01T00:00:00Z","timestamp":1485907200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,2]]},"DOI":"10.1109\/isscc.2017.7870300","type":"proceedings-article","created":{"date-parts":[[2017,3,7]],"date-time":"2017-03-07T19:34:02Z","timestamp":1488915242000},"page":"140-141","source":"Crossref","is-referenced-by-count":0,"title":["Session 8 overview: Digital PLLs and security circuits"],"prefix":"10.1109","author":[{"given":"Yasuhisa","family":"Shimazaki","sequence":"first","affiliation":[{"name":"Renesas Electronics, Tokyo, Japan"}]},{"given":"John","family":"Maneatis","sequence":"additional","affiliation":[{"name":"True Circuits, Los Altos, CA, United States of America"}]},{"given":"Edith","family":"Beign\u00e9","sequence":"additional","affiliation":[{"name":"CEA-LETI, Grenoble, France"}]}],"member":"263","event":{"name":"2017 IEEE International Solid- State Circuits Conference - (ISSCC)","start":{"date-parts":[[2017,2,5]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2017,2,9]]}},"container-title":["2017 IEEE International Solid-State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7866667\/7870233\/07870300.pdf?arnumber=7870300","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,28]],"date-time":"2024-02-28T18:51:37Z","timestamp":1709146297000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7870300\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,2]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/isscc.2017.7870300","relation":{},"subject":[],"published":{"date-parts":[[2017,2]]}}}