{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,25]],"date-time":"2026-10-25T22:01:31Z","timestamp":1792965691824,"version":"4.5.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,2]]},"DOI":"10.1109\/isscc.2017.7870303","type":"proceedings-article","created":{"date-parts":[[2017,3,7]],"date-time":"2017-03-07T19:34:02Z","timestamp":1488915242000},"page":"146-147","source":"Crossref","is-referenced-by-count":106,"title":["8.3 A 553F<sup>2<\/sup> 2-transistor amplifier-based Physically Unclonable Function (PUF) with 1.67% native instability"],"prefix":"10.1109","author":[{"given":"Kaiyuan","family":"Yang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qing","family":"Dong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Blaauw","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dennis","family":"Sylvester","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757433"},{"key":"ref3","first-page":"250","article-title":"A 3.07 &#x00B5;m2\/bitcell Physically Unclonable Function with 3.5% and 1 % Bit-Instability Across 0 to 80&#x00B0;C and 0.6 to 1.2V in a 65nm CMOS","author":"li","year":"2015","journal-title":"IEEE Symp VLSI Circuits"},{"key":"ref6","first-page":"254","article-title":"A Physically Unclonable Function with BER < 10&#x2013; 8 for Robust Chip Authentication Using Oscillator Collapse in 40nm, CMOS","author":"yang","year":"2014","journal-title":"ISSCC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910961"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063023"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417955"}],"event":{"name":"2017 IEEE International Solid- State Circuits Conference - (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2017,2,5]]},"end":{"date-parts":[[2017,2,9]]}},"container-title":["2017 IEEE International Solid-State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7866667\/7870233\/07870303.pdf?arnumber=7870303","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T10:43:45Z","timestamp":1489833825000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7870303\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,2]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isscc.2017.7870303","relation":{},"subject":[],"published":{"date-parts":[[2017,2]]}}}