{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,8]],"date-time":"2026-10-08T17:30:26Z","timestamp":1791480626599,"version":"4.3.4"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,2]]},"DOI":"10.1109\/isscc.2017.7870310","type":"proceedings-article","created":{"date-parts":[[2017,3,7]],"date-time":"2017-03-07T19:34:02Z","timestamp":1488915242000},"page":"160-161","source":"Crossref","is-referenced-by-count":99,"title":["9.2 A 0.6nJ \u22120.22\/+0.19\u00b0C inaccuracy temperature sensor using exponential subthreshold oscillation dependence"],"prefix":"10.1109","author":[{"given":"Kaiyuan","family":"Yang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qing","family":"Dong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wanyeong","family":"Jung","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiqun","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Myungjoon","family":"Choi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Blaauw","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dennis","family":"Sylvester","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","article-title":"A 0.85V 600nW All-CMOS Temperature Sensor with an Inaccuracy of &#x00B1;0.4&#x00B0;C (30) from ?40 to 125&#x00B0;C","author":"souri","year":"2014","journal-title":"ISSCC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2015.7231257"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2034201"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2325574"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2015.7231271"},{"key":"ref2","article-title":"A 1.1V 35&#x00B5;mx35&#x00B5;m Thermal Sensor with Supply Voltage Sensitivity of 2&#x00B0;C\/10%-supply for Thermal Management on the SX-9 Supercomputer","author":"saneyoshi","year":"2008","journal-title":"IEEE Symp VLSI Circuits"},{"key":"ref1","article-title":"Smart Temperature Sensor Survey","author":"makinwa","year":"2016","journal-title":"Rev 19062016"}],"event":{"name":"2017 IEEE International Solid- State Circuits Conference - (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2017,2,5]]},"end":{"date-parts":[[2017,2,9]]}},"container-title":["2017 IEEE International Solid-State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7866667\/7870233\/07870310.pdf?arnumber=7870310","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T10:48:42Z","timestamp":1489834122000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7870310\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,2]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/isscc.2017.7870310","relation":{},"subject":[],"published":{"date-parts":[[2017,2]]}}}