{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,11]],"date-time":"2026-04-11T20:53:51Z","timestamp":1775940831051,"version":"3.50.1"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2018,2,1]],"date-time":"2018-02-01T00:00:00Z","timestamp":1517443200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,2,1]],"date-time":"2018-02-01T00:00:00Z","timestamp":1517443200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,2]]},"DOI":"10.1109\/isscc.2018.8310274","type":"proceedings-article","created":{"date-parts":[[2018,3,16]],"date-time":"2018-03-16T15:53:18Z","timestamp":1521215598000},"page":"242-244","source":"Crossref","is-referenced-by-count":49,"title":["A signal-independent background-calibrating 20b 1MS\/S SAR ADC with 0.3ppm INL"],"prefix":"10.1109","author":[{"given":"Hongxing","family":"Li","sequence":"first","affiliation":[{"name":"Analog Devices, Wilmington, MA"}]},{"given":"Mark","family":"Maddox","sequence":"additional","affiliation":[{"name":"Analog Devices, Wilmington, MA"}]},{"given":"Michael C. W.","family":"Coln","sequence":"additional","affiliation":[{"name":"Analog Devices, Wilmington, MA"}]},{"given":"William","family":"Buckley","sequence":"additional","affiliation":[{"name":"Analog Devices, Cork, Ireland"}]},{"given":"Derek","family":"Hummerston","sequence":"additional","affiliation":[{"name":"Analog Devices, Newbury, United Kingdom"}]},{"given":"Naveed","family":"Naeem","sequence":"additional","affiliation":[{"name":"Analog Devices, Wilmington, MA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2123590"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2163556"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2010.5433829"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2015.7063125"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2017.7870468"}],"event":{"name":"2018 IEEE International Solid-State Circuits Conference - (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2018,2,11]]},"end":{"date-parts":[[2018,2,15]]}},"container-title":["2018 IEEE International Solid-State Circuits Conference - (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8304413\/8310156\/08310274.pdf?arnumber=8310274","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,28]],"date-time":"2025-05-28T04:42:06Z","timestamp":1748407326000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8310274\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,2]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/isscc.2018.8310274","relation":{},"subject":[],"published":{"date-parts":[[2018,2]]}}}