{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T16:07:13Z","timestamp":1784995633969,"version":"3.55.0"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,2]]},"DOI":"10.1109\/isscc.2019.8662412","type":"proceedings-article","created":{"date-parts":[[2019,3,18]],"date-time":"2019-03-18T23:16:55Z","timestamp":1552951015000},"page":"328-330","source":"Crossref","is-referenced-by-count":29,"title":["20.1 A 5GS\/s 7.2 ENOB Time-Interleaved VCO-Based ADC Achieving 30.5fJ\/conv-step"],"prefix":"10.1109","author":[{"given":"Maarten","family":"Baert","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wim","family":"Dehaene","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063129"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870372"},{"key":"ref6","first-page":"92c","article-title":"A 5.4GS\/s 12b 500mW pipeline ADC in 28nm CMOS","author":"wu","year":"2013","journal-title":"IEEE Symp VLSI Circuits"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2015.7338385"},{"key":"ref2","article-title":"ADC Performance Survey 1997–2018","author":"murmann","year":"0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537342"}],"event":{"name":"2019 IEEE International Solid- State Circuits Conference - (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2019,2,17]]},"end":{"date-parts":[[2019,2,21]]}},"container-title":["2019 IEEE International Solid- State Circuits Conference - (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8656625\/8662285\/08662412.pdf?arnumber=8662412","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:17:41Z","timestamp":1658261861000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8662412\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,2]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isscc.2019.8662412","relation":{},"subject":[],"published":{"date-parts":[[2019,2]]}}}