{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T06:43:57Z","timestamp":1764225837241},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,2,19]],"date-time":"2023-02-19T00:00:00Z","timestamp":1676764800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,19]],"date-time":"2023-02-19T00:00:00Z","timestamp":1676764800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,2,19]]},"DOI":"10.1109\/isscc42615.2023.10067516","type":"proceedings-article","created":{"date-parts":[[2023,3,23]],"date-time":"2023-03-23T17:38:07Z","timestamp":1679593087000},"page":"80-82","source":"Crossref","is-referenced-by-count":10,"title":["A 32kHz-Reference 2.4GHz Fractional-N Nonuniform Oversampling PLL with Gain-Boosted PD and Loop-Gain Calibration"],"prefix":"10.1109","author":[{"given":"Junjun","family":"Qiu","sequence":"first","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Wenqian","family":"Wang","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Zheng","family":"Sun","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Bangan","family":"Liu","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Yuncheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Dingxin","family":"Xu","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Hongye","family":"Huang","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Ashbir Aviat","family":"Fadila","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Zezheng","family":"Liu","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Waleed","family":"Madany","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Yuang","family":"Xiong","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Atsushi","family":"Shirane","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]},{"given":"Kenichi","family":"Okada","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology,Tokyo,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2015.2412680"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871632"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3106514"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8778010"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3101046"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2960485"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8778059"}],"event":{"name":"2023 IEEE International Solid- State Circuits Conference (ISSCC)","start":{"date-parts":[[2023,2,19]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2023,2,23]]}},"container-title":["2023 IEEE International Solid- State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10067248\/10067251\/10067516.pdf?arnumber=10067516","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,3]],"date-time":"2024-03-03T04:53:21Z","timestamp":1709441601000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10067516\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2,19]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/isscc42615.2023.10067516","relation":{},"subject":[],"published":{"date-parts":[[2023,2,19]]}}}