{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:22:31Z","timestamp":1778602951847,"version":"3.51.4"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,2,16]],"date-time":"2025-02-16T00:00:00Z","timestamp":1739664000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,16]],"date-time":"2025-02-16T00:00:00Z","timestamp":1739664000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,2,16]]},"DOI":"10.1109\/isscc49661.2025.10904615","type":"proceedings-article","created":{"date-parts":[[2025,3,6]],"date-time":"2025-03-06T18:33:12Z","timestamp":1741285992000},"page":"1-3","source":"Crossref","is-referenced-by-count":7,"title":["8.1 Dynamic Guard-Band Features of the IBM zNext System"],"prefix":"10.1109","author":[{"given":"Tobias","family":"Webel","sequence":"first","affiliation":[{"name":"IBM Systems,Böblingen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Phillip J.","family":"Restle","sequence":"additional","affiliation":[{"name":"IBM Research,Yorktown Heights,NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ramon","family":"Bertran","sequence":"additional","affiliation":[{"name":"IBM Research,Yorktown Heights,NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alper","family":"Buyuktosunoglu","sequence":"additional","affiliation":[{"name":"IBM Research,Yorktown Heights,NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sean M.","family":"Carey","sequence":"additional","affiliation":[{"name":"IBM Systems,Poughkeepsie,NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alejandro","family":"Cook","sequence":"additional","affiliation":[{"name":"IBM Systems,Böblingen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Karl","family":"Anderson","sequence":"additional","affiliation":[{"name":"IBM Systems,Poughkeepsie,NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Romain","sequence":"additional","affiliation":[{"name":"IBM Systems,Poughkeepsie,NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Strach","sequence":"additional","affiliation":[{"name":"IBM Systems,Böblingen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pradeep Bhadravati","family":"Parashurama","sequence":"additional","affiliation":[{"name":"IBM Systems,Bangalore,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aishwarya","family":"Tadkase","sequence":"additional","affiliation":[{"name":"IBM Systems,Bangalore,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rahman Abber","family":"Tahir","sequence":"additional","affiliation":[{"name":"IBM Systems,Böblingen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luke","family":"Jenkins","sequence":"additional","affiliation":[{"name":"IBM Systems,Poughkeepsie,NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kevin","family":"Low","sequence":"additional","affiliation":[{"name":"IBM Systems,Poughkeepsie,NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eberhard","family":"Engler","sequence":"additional","affiliation":[{"name":"IBM Systems,Böblingen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.870912"},{"issue":"1","key":"ref3","first-page":"32","article-title":"Razor II: In Situ Error Detection and Correction for PVT and SER Tolerance","volume":"44","author":"Das","year":"2009","journal-title":"IEEE JSSC"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7062936"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373462"},{"key":"ref6","first-page":"112","article-title":"Tunable Replica Circuits and Adaptive Voltage-Frequency Techniques for Dynamic Voltage, Temperature, and Aging Variation Tolerance","volume-title":"IEEE Symp. VLSI Circuits","author":"Tschanz","year":"2009"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.870925"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2011.29"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2155620.2155622"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/mm.2013.52"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2013.2237972"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757358"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2473655"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870452"},{"issue":"4","key":"ref15","first-page":"1028","article-title":"An Adaptive-Clocking-Control Circuit With 7.5%Freauency Gain for SPARC Processors","volume":"53","author":"Hashimoto","year":"2018","journal-title":"IEEE JSSC"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2012.6243807"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2017.7870449"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310303"},{"issue":"1","key":"ref19","first-page":"121","article-title":"I BM z14: Processor Characterization and Power Management for High-Reliability Mainframe Systems","volume":"54","author":"Berry","year":"2019","journal-title":"IEEE JSCC"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2020.3008143"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063030"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731541"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310304"},{"key":"ref24","first-page":"218","article-title":"Daterministic Frequency Roost and Voltage Enhancements on the POWER10 Processor","volume-title":"ISSCC","author":"Vanderpool","year":"2022"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/HCS61935.2024.10665304"}],"event":{"name":"2025 IEEE International Solid-State Circuits Conference (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2025,2,16]]},"end":{"date-parts":[[2025,2,20]]}},"container-title":["2025 IEEE International Solid-State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10904417\/10904496\/10904615.pdf?arnumber=10904615","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,7]],"date-time":"2025-03-07T06:31:06Z","timestamp":1741329066000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10904615\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2,16]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/isscc49661.2025.10904615","relation":{},"subject":[],"published":{"date-parts":[[2025,2,16]]}}}