{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T20:37:54Z","timestamp":1776199074686,"version":"3.50.1"},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,2,15]],"date-time":"2026-02-15T00:00:00Z","timestamp":1771113600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,15]],"date-time":"2026-02-15T00:00:00Z","timestamp":1771113600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,2,15]]},"DOI":"10.1109\/isscc49663.2026.11409139","type":"proceedings-article","created":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T20:50:24Z","timestamp":1772571024000},"page":"264-266","source":"Crossref","is-referenced-by-count":0,"title":["15.6 A 36GB 3.3TB\/S HBM4 DRAM with Per-Channel TSV RDQS Auto Calibration and Fully-Programmable MBIST"],"prefix":"10.1109","author":[{"given":"Sunghwan","family":"Joo","sequence":"first","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinyeon","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongsun","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ji-Young","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Youngsik","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong-Min","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ChiSung","family":"Oh","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyu-Ha","family":"Shim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haesuk","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Young-Yong","family":"Byun","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ChangHyun","family":"Bae","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joohwan","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Je-Min","family":"Ryu","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shin-haeng","family":"Kang","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaehoon","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Young-Uk","family":"Chang","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"JaeKyung","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"JongTae","family":"Hwang","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daehwan","family":"Seo","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ki-Heon","family":"Na","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Young Guen","family":"Song","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daihyun","family":"Lim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyung-Soo","family":"Ha","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Young-Soo","family":"Sohn","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sang-Joon","family":"Hwang","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2022.3193354"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2022.3232096"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49657.2024.10454440"},{"key":"ref4","first-page":"270","volume-title":"JESD270\u20134: JEDEC Standard High Bandwidth Memory (HBM) DRAM Specification","year":"2025"}],"event":{"name":"2026 IEEE International Solid-State Circuits Conference (ISSCC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2026,2,15]]},"end":{"date-parts":[[2026,2,19]]}},"container-title":["2026 IEEE International Solid-State Circuits Conference (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11408863\/11408946\/11409139.pdf?arnumber=11409139","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T19:33:12Z","timestamp":1776195192000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11409139\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2,15]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/isscc49663.2026.11409139","relation":{},"subject":[],"published":{"date-parts":[[2026,2,15]]}}}