{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T10:41:14Z","timestamp":1725446474682},"reference-count":1,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/issrew.2015.7392044","type":"proceedings-article","created":{"date-parts":[[2016,1,28]],"date-time":"2016-01-28T21:42:58Z","timestamp":1454017378000},"page":"65-65","source":"Crossref","is-referenced-by-count":2,"title":["Analyzing the reduction of test suite redundancy"],"prefix":"10.1109","author":[{"given":"Ingo","family":"Pill","sequence":"first","affiliation":[]},{"given":"Seema","family":"Jehan","sequence":"additional","affiliation":[]},{"given":"Franz","family":"Wotawa","sequence":"additional","affiliation":[]},{"given":"Mihai","family":"Nica","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-46675-9_5"}],"event":{"name":"2015 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","start":{"date-parts":[[2015,11,2]]},"location":"Gaithersburg, MD, USA","end":{"date-parts":[[2015,11,5]]}},"container-title":["2015 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7375770\/7392022\/07392044.pdf?arnumber=7392044","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T14:20:47Z","timestamp":1602685247000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7392044"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":1,"URL":"https:\/\/doi.org\/10.1109\/issrew.2015.7392044","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}