{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T08:22:36Z","timestamp":1730276556857,"version":"3.28.0"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/ist.2018.8577115","type":"proceedings-article","created":{"date-parts":[[2018,12,17]],"date-time":"2018-12-17T21:05:01Z","timestamp":1545080701000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Analysis of Leaks in Flood Embankments Using Deterministic Methods and Computational Intelligence Algorithms"],"prefix":"10.1109","author":[{"given":"Tomasz","family":"Rymarczyk","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Grzegorz","family":"Klosowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pawel","family":"Tchorzewski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"383","article-title":"Computer-Aided Machine Tool Selection for Focused Flexibility Manufacturing Systems Using Economical Criteria","volume":"124","author":"gola","year":"2011","journal-title":"Actual Problems of Economics"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1090\/conm\/615\/12267"},{"key":"ref12","article-title":"Introduction to biomedical electrical impedance tomography Electrical Impedance Tomography Methods, History and Applications","author":"holder","year":"2005","journal-title":"Bristol Inst Phys"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/17\/5\/301"},{"key":"ref14","first-page":"54","author":"kosicka","year":"2018","journal-title":"Intelligent Systems of Forecasting the Failure of Machinery Park and Supporting Fulfilment of Orders of Spare Parts"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"25902","DOI":"10.1088\/1361-6501\/aa50e1","article-title":"Singleshot high-voltage circuit for electrical capacitance tomography","volume":"28","author":"kryszyn","year":"2017","journal-title":"Measurement Science and Technology"},{"key":"ref16","first-page":"736","article-title":"Full wave numerical modelling of terahertz systems for nondestructive evaluation of dielectric structures","volume":"32","author":"lopato","year":"2013"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1515\/ipc-2016-0018"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"37","DOI":"10.5604\/01.3001.0010.4579","article-title":"Acceleration of image reconstruction process in the electrical capacitance tomography 3d in heterogeneous, multi-gpu system","volume":"7","author":"majchrowicz","year":"2017","journal-title":"Informatyka Automatyka Pomiary w Gospodarce i Ochronie ?rodowiska (IAPGO?)"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"12","DOI":"10.1016\/0021-9991(88)90002-2","article-title":"Fronts Propagating with Curvature Dependent Speed: Algorithms Based on Hamilton-Jacobi Formulations","volume":"79","author":"osher","year":"1988","journal-title":"J Comput Phys"},{"journal-title":"Industrial Tomography Systems and Applications","year":"2015","author":"wang","key":"ref28"},{"key":"ref4","first-page":"113","article-title":"Numerical Modeling of Magnetic Field Deformation as Related to Susceptibility Measured with an MR System","volume":"17","author":"bartu\u0161ek","year":"2008","journal-title":"Radioengineering"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.2528\/PIER09010202"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmultiphaseflow.2013.07.003"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2018.05.013"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1108\/COMPEL-12-2016-0530"},{"key":"ref5","first-page":"99","article-title":"Electrical impedance tomography, Inverse Problems","volume":"18","author":"borcea l","year":"2002"},{"key":"ref8","first-page":"68","article-title":"Nondestructive Method to Examine Brick Wall Dampness","author":"duda","year":"2016","journal-title":"International Interdisciplinary PhD Workshop 2016 Proceedings"},{"key":"ref7","first-page":"7520512","article-title":"Application of twin-plane ECT sensor for identification of the internal imperfections inside concrete beams Grudzien","author":"chaniecki","year":"2016","journal-title":"IEEE instrumentation and measurement technology conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10035-018-0809-y"},{"key":"ref9","first-page":"55","article-title":"The Shape Reconstruction of Unknown Objects for Inverse Problems","volume":"88","author":"filipowicz","year":"2012","journal-title":"Przegl?d Elektrotechniczny"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/27\/5\/S03"},{"key":"ref20","first-page":"227","article-title":"Tomography technology application","volume":"84","author":"polakowski","year":"2008","journal-title":"Przeglad Elektrotechniczny"},{"key":"ref22","first-page":"1551","article-title":"Big Data-Driven Contextual Processing Methods for Electrical Capacitance Tomography","author":"romanowski","year":"2018","journal-title":"IEEE Transactions on Industrial Informatics"},{"key":"ref21","doi-asserted-by":"crossref","first-page":"292","DOI":"10.3390\/s18010292","article-title":"Multi-Sensor Data Integration Using Deep Learning for Characterization of Defects in Steel Elements","volume":"18","author":"psuj","year":"2018","journal-title":"SENSORS"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"425","DOI":"10.17531\/ein.2018.3.11","article-title":"Application of neural reconstruction of tomographic images in the problem of reliability of flood protection facilities","volume":"20","author":"rymarczyk","year":"2018","journal-title":"Eksploatacja I NiezawodnoMaintenance and Reliability"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3233\/JAE-162071"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/21\/2\/307"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/s18072285"}],"event":{"name":"2018 IEEE International Conference on Imaging Systems and Techniques (IST)","start":{"date-parts":[[2018,10,16]]},"location":"Krakow","end":{"date-parts":[[2018,10,18]]}},"container-title":["2018 IEEE International Conference on Imaging Systems and Techniques (IST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8556631\/8577077\/08577115.pdf?arnumber=8577115","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T06:36:38Z","timestamp":1643265398000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8577115\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/ist.2018.8577115","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}