{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,13]],"date-time":"2026-06-13T16:29:28Z","timestamp":1781368168375,"version":"3.54.1"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,14]],"date-time":"2024-10-14T00:00:00Z","timestamp":1728864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,14]],"date-time":"2024-10-14T00:00:00Z","timestamp":1728864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001869","name":"Academia Sinica","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001869","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,14]]},"DOI":"10.1109\/ist63414.2024.10759237","type":"proceedings-article","created":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T19:44:32Z","timestamp":1736538272000},"page":"1-5","source":"Crossref","is-referenced-by-count":13,"title":["YOLO-Based Defect Detection for Metal Sheets"],"prefix":"10.1109","author":[{"given":"Po-Heng","family":"Chou","sequence":"first","affiliation":[{"name":"Research Center for Information Technology Innovation (CITI), Academia Sinica (AS),Taipei,Taiwan,11529"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chun-Chi","family":"Wang","sequence":"additional","affiliation":[{"name":"Graduate School of Engineering Science and Technology, National Yunlin University of Science and Technology (NYUST),Department of Electrical Engineering,Yunlin,Taiwan,64002"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wei-Lung","family":"Mao","sequence":"additional","affiliation":[{"name":"Graduate School of Engineering Science and Technology, National Yunlin University of Science and Technology (NYUST),Department of Electrical Engineering,Yunlin,Taiwan,64002"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","event":{"name":"2024 IEEE International Conference on Imaging Systems and Techniques (IST)","location":"Tokyo, Japan","start":{"date-parts":[[2024,10,14]]},"end":{"date-parts":[[2024,10,16]]}},"container-title":["2024 IEEE International Conference on Imaging Systems and Techniques (IST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10759138\/10759143\/10759237.pdf?arnumber=10759237","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T19:44:46Z","timestamp":1736538286000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10759237\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,14]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/ist63414.2024.10759237","relation":{},"subject":[],"published":{"date-parts":[[2024,10,14]]}}}