{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T19:10:20Z","timestamp":1771960220430,"version":"3.50.1"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,14]],"date-time":"2024-10-14T00:00:00Z","timestamp":1728864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,14]],"date-time":"2024-10-14T00:00:00Z","timestamp":1728864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,14]]},"DOI":"10.1109\/ist63414.2024.10759240","type":"proceedings-article","created":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T19:44:32Z","timestamp":1736538272000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["High Accuracy Vision-Laser Post-Welding Defect Detection and Segmentation Method Based on Convolutional Neural Networks"],"prefix":"10.1109","author":[{"given":"Guo","family":"Chen","sequence":"first","affiliation":[{"name":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"}]},{"given":"Zijian","family":"Fan","sequence":"additional","affiliation":[{"name":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"}]},{"given":"Binyang","family":"She","sequence":"additional","affiliation":[{"name":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"}]},{"given":"Shule","family":"Xing","sequence":"additional","affiliation":[{"name":"College of Energy Engineering, Huanghuai University,Henan,China"}]},{"given":"Wei","family":"Tao","sequence":"additional","affiliation":[{"name":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"}]},{"given":"Hui","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"}]},{"given":"Na","family":"Lv","sequence":"additional","affiliation":[{"name":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"}]}],"member":"263","event":{"name":"2024 IEEE International Conference on Imaging Systems and Techniques (IST)","location":"Tokyo, Japan","start":{"date-parts":[[2024,10,14]]},"end":{"date-parts":[[2024,10,16]]}},"container-title":["2024 IEEE International Conference on Imaging Systems and Techniques (IST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10759138\/10759143\/10759240.pdf?arnumber=10759240","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T19:44:32Z","timestamp":1736538272000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10759240\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,14]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/ist63414.2024.10759240","relation":{},"subject":[],"published":{"date-parts":[[2024,10,14]]}}}