{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T08:16:54Z","timestamp":1764836214722,"version":"3.46.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T00:00:00Z","timestamp":1760486400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T00:00:00Z","timestamp":1760486400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005089","name":"Beijing Municipal Natural Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100005089","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,15]]},"DOI":"10.1109\/ist66504.2025.11268361","type":"proceedings-article","created":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T18:40:03Z","timestamp":1764787203000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["High-Resolution Lung Imaging with an Improved Physics-Informed Neural Network via Electrical Impedance Tomography"],"prefix":"10.1109","author":[{"given":"Zexin","family":"Zhu","sequence":"first","affiliation":[{"name":"Beihang University,School of Instrument and Opto-electronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zuowei","family":"Wang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrument and Opto-electronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zitang","family":"Yuan","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrument and Opto-electronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaolin","family":"Li","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrument and Opto-electronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anran","family":"Ma","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrument and Opto-electronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiyao","family":"Zhao","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrument and Opto-electronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiangtao","family":"Sun","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrument and Opto-electronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrument and Opto-electronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.21037\/atm.2017.07.20"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TIP.2015.2493446"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TIP.2003.819229"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TIM.2021.3064802"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TMI.2020.3025080"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/JSEN.2018.2876411"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/JSEN.2020.2973337"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TIM.2022.3218515"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TIM.2020.3012378"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/JSEN.2021.3050845"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.bspc.2022.104421"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/JIOT.2024.3380845"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.jcp.2018.10.045"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1007\/s10915-022-01939-z"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.neunet.2025.107410"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/LSP.2025.3545306"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1007\/s10278-013-9622-7"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/CVPR.2016.90"}],"event":{"name":"2025 IEEE International Conference on Imaging Systems and Techniques (IST)","start":{"date-parts":[[2025,10,15]]},"location":"Strasbourg, France","end":{"date-parts":[[2025,10,17]]}},"container-title":["2025 IEEE International Conference on Imaging Systems and Techniques (IST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11268367\/11268353\/11268361.pdf?arnumber=11268361","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T08:13:01Z","timestamp":1764835981000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11268361\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,15]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/ist66504.2025.11268361","relation":{},"subject":[],"published":{"date-parts":[[2025,10,15]]}}}