{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T18:50:44Z","timestamp":1764874244115,"version":"3.46.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T00:00:00Z","timestamp":1760486400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T00:00:00Z","timestamp":1760486400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,15]]},"DOI":"10.1109\/ist66504.2025.11268420","type":"proceedings-article","created":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T18:40:03Z","timestamp":1764787203000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A TDLAS Imaging Model for Precise Tomography of Temperature and Gas Molar Concentration"],"prefix":"10.1109","author":[{"given":"Kai","family":"Zhao","sequence":"first","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhang","family":"Cao","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiding","family":"Wang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yanjun","family":"Ding","sequence":"additional","affiliation":[{"name":"Tsinghua University,Department of Energy and Power Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yanjun","family":"Du","sequence":"additional","affiliation":[{"name":"North China Electric Power University,School of Control and Computer Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gang","family":"Wang","sequence":"additional","affiliation":[{"name":"Chongqing Chuanyi Automation Co., Ltd.,Chongqing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3470052"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2025.118169"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6595\/ac99fc"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ecmx.2025.100964"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3400350"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3165802"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3271738"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3207792"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2017.2690143"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3389\/fphy.2022.1036179"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.fuel.2020.117370"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3144211"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3110282"}],"event":{"name":"2025 IEEE International Conference on Imaging Systems and Techniques (IST)","start":{"date-parts":[[2025,10,15]]},"location":"Strasbourg, France","end":{"date-parts":[[2025,10,17]]}},"container-title":["2025 IEEE International Conference on Imaging Systems and Techniques (IST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11268367\/11268353\/11268420.pdf?arnumber=11268420","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T18:35:39Z","timestamp":1764873339000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11268420\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,15]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/ist66504.2025.11268420","relation":{},"subject":[],"published":{"date-parts":[[2025,10,15]]}}}