{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T09:06:34Z","timestamp":1764839194110,"version":"3.46.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T00:00:00Z","timestamp":1760486400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T00:00:00Z","timestamp":1760486400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,15]]},"DOI":"10.1109\/ist66504.2025.11268427","type":"proceedings-article","created":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T18:40:03Z","timestamp":1764787203000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Accurate Temperature Model for Premixed H\n                    <sub>2<\/sub>\n                    \/O\n                    <sub>2<\/sub>\n                    Flame Imaging via Lateral Shearing Interferometry"],"prefix":"10.1109","author":[{"given":"Dandan","family":"Huang","sequence":"first","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhang","family":"Cao","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2023.11.289"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.2322\/tjsass.60.116"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.2514\/6.1996-646"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/1674-1056\/22\/4\/044701"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2024.118746"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.proci.2010.06.050"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2014.12.018"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.combustflame.2023.113079"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.fuel.2023.129714"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CDCIEM.2011.208"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s003400050020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.proci.2022.09.001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s00348-025-04007-y"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC60896.2024.10561065"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC60896.2024.10561197"},{"issue":"4","key":"ref16","first-page":"325336","article-title":"Shearing Interferometry: Recent Research Trends and Applications","volume":"7","author":"Joo","year":"2023","journal-title":"Curr. Opt. Photonics"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.107835"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2024.3363701"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.2514\/6.2004-5618"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/cphc.202000301"}],"event":{"name":"2025 IEEE International Conference on Imaging Systems and Techniques (IST)","start":{"date-parts":[[2025,10,15]]},"location":"Strasbourg, France","end":{"date-parts":[[2025,10,17]]}},"container-title":["2025 IEEE International Conference on Imaging Systems and Techniques (IST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11268367\/11268353\/11268427.pdf?arnumber=11268427","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T09:01:44Z","timestamp":1764838904000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11268427\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,15]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/ist66504.2025.11268427","relation":{},"subject":[],"published":{"date-parts":[[2025,10,15]]}}}