{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T08:12:56Z","timestamp":1764835976154,"version":"3.46.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T00:00:00Z","timestamp":1760486400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T00:00:00Z","timestamp":1760486400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,15]]},"DOI":"10.1109\/ist66504.2025.11268433","type":"proceedings-article","created":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T18:40:03Z","timestamp":1764787203000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Explicit Linear Levenberg\u2013Marquardt Method for Image Reconstruction in Electrical Capacitance Tomography"],"prefix":"10.1109","author":[{"given":"Damian","family":"Wanta","sequence":"first","affiliation":[{"name":"Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Waldemar T.","family":"Smolik","sequence":"additional","affiliation":[{"name":"Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mikhail","family":"Ivanenko","sequence":"additional","affiliation":[{"name":"Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/el:19880283"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1515\/phys-2018-0046"},{"article-title":"Imaging Industrial Flows; Applications of Electrical Process Tomography","year":"1995","author":"Plaskowski","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2652367"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/7\/3\/013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1108\/sr-01-2016-0027"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2174438"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/4\/042001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/30\/6\/S03"},{"article-title":"A Non-linear Model of Sensitivity Matrix for Electrical Capacitance Tomography","volume-title":"Annual Meeting of the Electrostatics Society of America","author":"Villares et al","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/10\/11\/315"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2919923"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10957-020-01666-1"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/16\/10\/014"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s18113701"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s19071521"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TRPMS.2017.2722863"},{"key":"ref18","article-title":"ECTsim","author":"Wanta","year":"2024","journal-title":"Zenodo"}],"event":{"name":"2025 IEEE International Conference on Imaging Systems and Techniques (IST)","start":{"date-parts":[[2025,10,15]]},"location":"Strasbourg, France","end":{"date-parts":[[2025,10,17]]}},"container-title":["2025 IEEE International Conference on Imaging Systems and Techniques (IST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11268367\/11268353\/11268433.pdf?arnumber=11268433","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T08:09:15Z","timestamp":1764835755000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11268433\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,15]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/ist66504.2025.11268433","relation":{},"subject":[],"published":{"date-parts":[[2025,10,15]]}}}