{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T09:48:36Z","timestamp":1725788916781},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/istel.2016.7881917","type":"proceedings-article","created":{"date-parts":[[2017,3,20]],"date-time":"2017-03-20T20:34:21Z","timestamp":1490042061000},"page":"719-722","source":"Crossref","is-referenced-by-count":4,"title":["SRAM hardware Trojan"],"prefix":"10.1109","author":[{"given":"Roghayeh","family":"Saeidi","sequence":"first","affiliation":[]},{"given":"Hossein","family":"Gharaee Garakani","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"VLSI Test Principles and Architectures_ Design for Testability","author":"wang","year":"2006","journal-title":"Morgan Kaufmann SanFrancisco CA"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2334493"},{"key":"ref5","article-title":"Introduction to VLSI Systems: A Logic, Circuit, and System Perspective","author":"lin","year":"2011","journal-title":"CRC Press"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2335155"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"2011","key":"ref1"}],"event":{"name":"2016 8th International Symposium on Telecommunications (IST)","start":{"date-parts":[[2016,9,27]]},"location":"Tehran, Iran","end":{"date-parts":[[2016,9,28]]}},"container-title":["2016 8th International Symposium on Telecommunications (IST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7878240\/7881760\/07881917.pdf?arnumber=7881917","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,28]],"date-time":"2017-03-28T03:05:22Z","timestamp":1490670322000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7881917\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/istel.2016.7881917","relation":{},"subject":[],"published":{"date-parts":[[2016,9]]}}}