{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T10:46:56Z","timestamp":1761562016911},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/isvdat.2015.7208062","type":"proceedings-article","created":{"date-parts":[[2015,8,20]],"date-time":"2015-08-20T17:53:11Z","timestamp":1440093191000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Pre-layout estimation of performance and design of basic analog circuits in stress enabled technologies"],"prefix":"10.1109","author":[{"given":"Arvind Kumar","family":"Sharma","sequence":"first","affiliation":[]},{"given":"Neeraj","family":"Mishra","sequence":"additional","affiliation":[]},{"given":"Naushad","family":"Alam","sequence":"additional","affiliation":[]},{"given":"Sudeb","family":"Dasgupta","sequence":"additional","affiliation":[]},{"given":"Anand","family":"Bulusu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687497"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/BMAS.2010.6156590"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2046699"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724646"},{"year":"2011","key":"ref14","article-title":"Synopsys, TCAD Sentaurus"},{"year":"2009","key":"ref15","article-title":"International Technology Roadmap for Semiconductors"},{"year":"0","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.2936890"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2210426"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/16.944190"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2026121"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2102374"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2214389"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691134"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2066567"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2010.5617407"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687496"},{"key":"ref9","first-page":"34","article-title":"Modeling stress-induced variability at advanced IC process nodes","author":"hurat","year":"2012","journal-title":"Electronic Engineering Times Europe"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-matsci-082908-145312"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2042882"},{"key":"ref22","article-title":"Design of Analog CMOS Integrated Circuits","author":"razavi","year":"2009","journal-title":"TMH"},{"key":"ref21","first-page":"396","article-title":"Characterizing process variation in nanometer CMOS","author":"agarwal","year":"2007","journal-title":"ACM\/IEEE Design Automation Conference"},{"key":"ref24","first-page":"1","article-title":"A robust to PVT fully-differential amplifier in 45nm SOl-CMOS technology","author":"amaya","year":"2013","journal-title":"IEEE Latin American Symposium on Circuits and Systems"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MPOT.2007.913680"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.881001"}],"event":{"name":"2015 19th International Symposium on VLSI Design and Test (VDAT)","start":{"date-parts":[[2015,6,26]]},"location":"Ahmedabad, India","end":{"date-parts":[[2015,6,29]]}},"container-title":["2015 19th International Symposium on VLSI Design and Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7166536\/7208044\/07208062.pdf?arnumber=7208062","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T17:36:47Z","timestamp":1490377007000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7208062\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/isvdat.2015.7208062","relation":{},"subject":[],"published":{"date-parts":[[2015,6]]}}}