{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:10:33Z","timestamp":1729620633128,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/isvdat.2015.7208110","type":"proceedings-article","created":{"date-parts":[[2015,8,20]],"date-time":"2015-08-20T17:53:11Z","timestamp":1440093191000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Transient current estimation using S3C (Standard cell current transient characterization)"],"prefix":"10.1109","author":[{"given":"Michael","family":"Skaggs","sequence":"first","affiliation":[]},{"given":"Sushmita K.","family":"Rao","sequence":"additional","affiliation":[]},{"given":"Ryan","family":"Robucci","sequence":"additional","affiliation":[]},{"given":"Nilanjan","family":"Banerjee","sequence":"additional","affiliation":[]},{"given":"Chintan","family":"Patel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2000.878270"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.77"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"125","DOI":"10.1007\/s10836-013-5425-5","article-title":"Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path Delay","volume":"30","author":"rao","year":"2014","journal-title":"Journal of Electronic Testing"},{"journal-title":"CCS Timing Library Characterization Guidelines Version 3 2 Synopsys","year":"2008","key":"ref6"},{"journal-title":"Open Source ECSM Format Specification Version 2 1 Cadence","year":"2006","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2197427"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537092"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.52"},{"key":"ref9","first-page":"6","article-title":"Gate delay modeling with multiple input switching for static (statistical) timing analysis, VLSI Design, 2006","author":"sridharan","year":"2006","journal-title":"Held jointly with 5th International Conference on Embedded Systems and Design 19th International Conference on"},{"journal-title":"Estimation of Dynamic Current Waveforms using Pre-Characterization of Standard Cells Latin-American Test Symposium","year":"2015","author":"shivashankar","key":"ref1"}],"event":{"name":"2015 19th International Symposium on VLSI Design and Test (VDAT)","start":{"date-parts":[[2015,6,26]]},"location":"Ahmedabad, India","end":{"date-parts":[[2015,6,29]]}},"container-title":["2015 19th International Symposium on VLSI Design and Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7166536\/7208044\/07208110.pdf?arnumber=7208110","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T14:01:44Z","timestamp":1498226504000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7208110\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/isvdat.2015.7208110","relation":{},"subject":[],"published":{"date-parts":[[2015,6]]}}}