{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:23:32Z","timestamp":1764174212124},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/isvdat.2015.7208122","type":"proceedings-article","created":{"date-parts":[[2015,8,20]],"date-time":"2015-08-20T21:53:11Z","timestamp":1440107591000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["GA based diagnostic test pattern generation for transition faults"],"prefix":"10.1109","author":[{"given":"Anupam","family":"Bhar","sequence":"first","affiliation":[]},{"given":"Santanu","family":"Chattopadhyay","sequence":"additional","affiliation":[]},{"given":"Indranil","family":"Sengupta","sequence":"additional","affiliation":[]},{"given":"Rohit","family":"Kapur","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.298042"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527892"},{"journal-title":"Soft Computing by D K Pratihar","year":"2008","key":"ref12"},{"year":"0","key":"ref13"},{"year":"0","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556973"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/TEST.2006.297647","article-title":"Diagnostic Test Generation for Arbitrary Faults","author":"bhatti","year":"2006","journal-title":"Test Conference 2006 ITC '06 IEEE International"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20070029"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2011.6081382"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.44"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2011.15"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.14"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2006.56"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.924832"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024824"}],"event":{"name":"2015 19th International Symposium on VLSI Design and Test (VDAT)","start":{"date-parts":[[2015,6,26]]},"location":"Ahmedabad, India","end":{"date-parts":[[2015,6,29]]}},"container-title":["2015 19th International Symposium on VLSI Design and Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7166536\/7208044\/07208122.pdf?arnumber=7208122","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T18:01:43Z","timestamp":1498240903000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7208122\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/isvdat.2015.7208122","relation":{},"subject":[],"published":{"date-parts":[[2015,6]]}}}