{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T05:28:40Z","timestamp":1725514120708},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/isvdat.2015.7208146","type":"proceedings-article","created":{"date-parts":[[2015,8,20]],"date-time":"2015-08-20T17:53:11Z","timestamp":1440093191000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Performance study of side block oxide band gap engineered SONOS: A device simulation approach"],"prefix":"10.1109","author":[{"given":"Gagan","family":"Deep Verma","sequence":"first","affiliation":[]},{"given":"Manisha","family":"Pattanaik","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ELECO.2013.6713868"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"51","DOI":"10.1109\/NVMT.2004.1380804","article-title":"Characterization of scaled SONOS EEPROM memory devices for space and military systems","author":"white","year":"2004","journal-title":"Non-Volatile Memory Technology Symposium 2004"},{"key":"ref10","first-page":"547","article-title":"BE-SONOS: A bandgap engineered SONOS with excellent performance and reliability","author":"lue","year":"2005","journal-title":"Electron Devices Meeting 2005 IEDM Technical Digest IEEE International"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/101.857747"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.811702"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047085"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2006.306465"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SMELEC.2014.6920891"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISVDAT.2014.6881090"},{"article-title":"Nonvolatile Memory Technologies with Emphasis on Flash: A Comprehensive Guide to understanding and using flash memory devices","year":"2008","author":"brewer","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2303860"}],"event":{"name":"2015 19th International Symposium on VLSI Design and Test (VDAT)","start":{"date-parts":[[2015,6,26]]},"location":"Ahmedabad, India","end":{"date-parts":[[2015,6,29]]}},"container-title":["2015 19th International Symposium on VLSI Design and Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7166536\/7208044\/07208146.pdf?arnumber=7208146","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T14:01:43Z","timestamp":1498226503000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7208146\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/isvdat.2015.7208146","relation":{},"subject":[],"published":{"date-parts":[[2015,6]]}}}