{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T06:09:18Z","timestamp":1758089358622,"version":"3.44.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,6]],"date-time":"2025-07-06T00:00:00Z","timestamp":1751760000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,6]],"date-time":"2025-07-06T00:00:00Z","timestamp":1751760000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,6]]},"DOI":"10.1109\/isvlsi65124.2025.11130230","type":"proceedings-article","created":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T18:20:15Z","timestamp":1756318815000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["HardObfSec: Measuring Hardware Obfuscation Security at RTL"],"prefix":"10.1109","author":[{"given":"Sonam","family":"Sharma","sequence":"first","affiliation":[{"name":"University of Hyderabad,Hyderabad,India"}]},{"given":"Dipanjan","family":"Roy","sequence":"additional","affiliation":[{"name":"Institute for Development & Research in Banking Technology\nHyderabad, India"}]},{"given":"Digambar","family":"Pawar","sequence":"additional","affiliation":[{"name":"University of Hyderabad,Hyderabad,India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HOST54066.2022.9840309"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCE.2019.8661835"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2818720"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2017.01.021"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3340350"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCE56470.2023.10043486"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7428086"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS56346.2023.10139952"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2018.2890616"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.2981034"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3244902"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10137136"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3583781.3590277"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2017.015072"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2323976"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10136931"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401283"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3410337"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2018.8357321"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3074004"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465830"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3701032"},{"volume-title":"Express Benchmarks","year":"2025","key":"ref23"}],"event":{"name":"2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","start":{"date-parts":[[2025,7,6]]},"location":"Kalamata, Greece","end":{"date-parts":[[2025,7,9]]}},"container-title":["2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11129697\/11130193\/11130230.pdf?arnumber=11130230","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,16]],"date-time":"2025-09-16T05:22:15Z","timestamp":1758000135000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11130230\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,6]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/isvlsi65124.2025.11130230","relation":{},"subject":[],"published":{"date-parts":[[2025,7,6]]}}}