{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T10:21:56Z","timestamp":1725618116795},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/itc-asia.2017.8097129","type":"proceedings-article","created":{"date-parts":[[2017,11,6]],"date-time":"2017-11-06T21:35:46Z","timestamp":1510004146000},"page":"138-143","source":"Crossref","is-referenced-by-count":2,"title":["A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor"],"prefix":"10.1109","author":[{"given":"Davide","family":"Appello","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Laurino","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Pranzo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/00207540701636306"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2011.08.014"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2012.716172"},{"journal-title":"Gurobi Optimization Inc","article-title":"Gurobi optimizer reference manual","year":"2016","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2011.2114900"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0166-3615(01)00081-1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-011-0570-0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2007.07.026"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2015.04.004"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-013-0746-x"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/BF00170018"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10951-010-0222-9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(03)00264-9"}],"event":{"name":"2017 International Test Conference in Asia (ITC-Asia)","start":{"date-parts":[[2017,9,13]]},"location":"Taipei","end":{"date-parts":[[2017,9,15]]}},"container-title":["2017 International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8086228\/8097091\/08097129.pdf?arnumber=8097129","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,1,11]],"date-time":"2018-01-11T23:38:46Z","timestamp":1515713926000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8097129\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/itc-asia.2017.8097129","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}