{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T08:33:04Z","timestamp":1730277184774,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T00:00:00Z","timestamp":1694476800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T00:00:00Z","timestamp":1694476800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,12]]},"DOI":"10.1109\/itc-asia58802.2023.10301164","type":"proceedings-article","created":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T18:07:23Z","timestamp":1698862043000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Integrated Progressive Built-In Self-Repair (IPBISR) Techniques for NAND Flash Memory"],"prefix":"10.1109","author":[{"given":"Shyue-Kung","family":"Lu","sequence":"first","affiliation":[{"name":"National Taiwan University of Science and Technology,Taipei City 10607,Taiwan"}]},{"given":"Xin","family":"Dong","sequence":"additional","affiliation":[{"name":"National Taiwan University of Science and Technology,Taipei City 10607,Taiwan"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2280078"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2840350"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.885828"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2017.7939074"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1965.1053825"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2013.190"},{"key":"ref1","first-page":"2e.1.1","article-title":"Scaling and Reliability of NAND Flash Devices","author":"park","year":"2014","journal-title":"Proc IEEE 52nd Int Reliab Phys Symp (IRPS)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00047"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2013.49"},{"journal-title":"Fault-Tolerant Computing Theory and Techniques","year":"0","author":"pradhan","key":"ref19"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"1817","DOI":"10.1109\/5.705525","article-title":"Defect tolerant VLSI circuits: techniques and yield analysis","volume":"86","author":"koren","year":"1998","journal-title":"Proc IEEE"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2008.4581627"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2049051"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2713127"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2725738"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.885828"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2008.2007477"}],"event":{"name":"2023 IEEE International Test Conference in Asia (ITC-Asia)","start":{"date-parts":[[2023,9,12]]},"location":"Matsue, Japan","end":{"date-parts":[[2023,9,14]]}},"container-title":["2023 IEEE International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10301149\/10301156\/10301164.pdf?arnumber=10301164","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T19:32:43Z","timestamp":1701113563000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10301164\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,12]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/itc-asia58802.2023.10301164","relation":{},"subject":[],"published":{"date-parts":[[2023,9,12]]}}}