{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,11]],"date-time":"2026-04-11T04:26:54Z","timestamp":1775881614233,"version":"3.50.1"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,8,18]],"date-time":"2024-08-18T00:00:00Z","timestamp":1723939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,18]],"date-time":"2024-08-18T00:00:00Z","timestamp":1723939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,8,18]]},"DOI":"10.1109\/itc-asia62534.2024.10661320","type":"proceedings-article","created":{"date-parts":[[2024,9,10]],"date-time":"2024-09-10T18:23:28Z","timestamp":1725992608000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["SCD-PUF: Shuffled Chaotic-dual-PUF With High Machine Learning Attack Resilience"],"prefix":"10.1109","author":[{"given":"Yijing","family":"Peng","sequence":"first","affiliation":[{"name":"National University of Defense Technology,Key Laboratory of Advanced Microprocessor Chips and Systems,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ding","family":"Deng","sequence":"additional","affiliation":[{"name":"National University of Defense Technology,College of Electronic Science and Technology,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhenyu","family":"Wang","sequence":"additional","affiliation":[{"name":"Hunan University,College of Semiconductors,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yang","family":"Guo","sequence":"additional","affiliation":[{"name":"National University of Defense Technology,Key Laboratory of Advanced Microprocessor Chips and Systems,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICRITO51393.2021.9596298"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.18280\/isi.240413"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2962115"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2021.i2.357-389"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278484"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3090475"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3028508"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530412"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID49098.2020.00051"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3285930"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2024.3372801"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2023.106070"},{"key":"ref13","article-title":"Puf evaluation metrics on 7 series fpga: Comparative analysis of arbiter, xor arbiter, and double arbiter pufs for uniqueness, randomness, and stability","author":"Sima","year":"2024"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID60093.2024.00095"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2017.2713305"},{"key":"ref16","doi-asserted-by":"crossref","DOI":"10.1145\/3649329.3658246","article-title":"S2ram puf: An ultra-low power subthreshold sram puf with zero bit error rate","author":"Ni","year":"2024"},{"key":"ref17","first-page":"125 749","article-title":"Machine learning in chaos-based encryption: Theory, implementations, and applications","author":"Sayadi","year":"2023","journal-title":"IEEE Access"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3111588"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855582"}],"event":{"name":"2024 IEEE International Test Conference in Asia (ITC-Asia)","location":"Changsha, China","start":{"date-parts":[[2024,8,18]]},"end":{"date-parts":[[2024,8,20]]}},"container-title":["2024 IEEE International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10661305\/10661306\/10661320.pdf?arnumber=10661320","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T23:49:20Z","timestamp":1732751360000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10661320\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8,18]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/itc-asia62534.2024.10661320","relation":{},"subject":[],"published":{"date-parts":[[2024,8,18]]}}}