{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T08:33:25Z","timestamp":1730277205168,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,8,18]],"date-time":"2024-08-18T00:00:00Z","timestamp":1723939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,18]],"date-time":"2024-08-18T00:00:00Z","timestamp":1723939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012492","name":"Youth Innovation Promotion Association","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012492","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,8,18]]},"DOI":"10.1109\/itc-asia62534.2024.10661347","type":"proceedings-article","created":{"date-parts":[[2024,9,10]],"date-time":"2024-09-10T18:23:28Z","timestamp":1725992608000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A Static Test Compaction Method Based on GCN Assisted Fault Gate Classification"],"prefix":"10.1109","author":[{"given":"Zhiteng","family":"Chao","sequence":"first","affiliation":[{"name":"Chinese Academy of Sciences,State Key Lab of Processors, Institute of Computing Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qinluan","family":"Dai","sequence":"additional","affiliation":[{"name":"University of Science and Technology Bejing"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiale","family":"Li","sequence":"additional","affiliation":[{"name":"University of Science and Technology Bejing"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zizhen","family":"Liu","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences,State Key Lab of Processors, Institute of Computing Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenxing","family":"Li","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences,State Key Lab of Processors, Institute of Computing Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongqin","family":"Lyu","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences,State Key Lab of Processors, Institute of Computing Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jing","family":"Ye","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences,State Key Lab of Processors, Institute of Computing Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Huawei","family":"Li","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences,State Key Lab of Processors, Institute of Computing Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaowei","family":"Li","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences,State Key Lab of Processors, Institute of Computing Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1988.122533"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.2378285"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090834"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2009.178"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651914"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.238040"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.476580"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1992.224429"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/43.856980"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3240246"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3372780.3378173"},{"journal-title":"Semi-supervised classification with graph convolutional networks","year":"2016","author":"Kipf","key":"ref12"},{"key":"ref13","article-title":"Inductive representation learning on large graphs","volume":"30","author":"Hamilton","year":"2017","journal-title":"Advances in neural information processing systems"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.113997"},{"key":"ref15","first-page":"1","article-title":"Why are graph neural networks effective for eda problems?","volume-title":"Proceedings of the 41st IEEE\/ACM International Conference on Computer-Aided Design","author":"Ren"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/800139.804528"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-09284-3_33"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2552822"}],"event":{"name":"2024 IEEE International Test Conference in Asia (ITC-Asia)","start":{"date-parts":[[2024,8,18]]},"location":"Changsha, China","end":{"date-parts":[[2024,8,20]]}},"container-title":["2024 IEEE International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10661305\/10661306\/10661347.pdf?arnumber=10661347","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T08:18:23Z","timestamp":1726042703000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10661347\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8,18]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/itc-asia62534.2024.10661347","relation":{},"subject":[],"published":{"date-parts":[[2024,8,18]]}}}