{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T08:19:26Z","timestamp":1772007566269,"version":"3.50.1"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,12,16]],"date-time":"2025-12-16T00:00:00Z","timestamp":1765843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,16]],"date-time":"2025-12-16T00:00:00Z","timestamp":1765843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,12,16]]},"DOI":"10.1109\/itc-asia67627.2025.00016","type":"proceedings-article","created":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T20:56:07Z","timestamp":1771966567000},"page":"43-47","source":"Crossref","is-referenced-by-count":0,"title":["FALCO-WAFER: Feature-Aware Lightweight Contextual Detector for Wafer Defect Detection"],"prefix":"10.1109","author":[{"given":"Haotian","family":"Zhang","sequence":"first","affiliation":[{"name":"Nanjing University,School of Integrated Circuits,Suzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shurong","family":"Cao","sequence":"additional","affiliation":[{"name":"Nanjing University,School of Integrated Circuits,Suzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ningmu","family":"Zou","sequence":"additional","affiliation":[{"name":"Nanjing University,School of Integrated Circuits,Suzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2015.2405252"},{"issue":"2","key":"ref2","first-page":"246","article-title":"Defectnet: Cnn-based surface defect detection for semiconductor wafers","volume":"33","author":"Park","year":"2020","journal-title":"IEEE Trans. Semiconductor Manufacturing"},{"key":"ref3","article-title":"Dino: Detr with improved denoising training","volume-title":"Proc. ICLR","author":"Li"},{"key":"ref4","article-title":"Semiconductor wafer map defect classification with tiny vision transformers","author":"Mohammad","year":"2024"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2937793"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS52891.2021.00019"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref8","first-page":"531","article-title":"Mutual information neural estimation","volume-title":"International conference on machine learning","author":"Belghazi"},{"key":"ref9","article-title":"Texture-ad: An anomaly detection dataset and benchmark for real algorithm development","author":"Lei","year":"2024"},{"key":"ref10","article-title":"Rt-detr: Real-time detection transformers","author":"Li","year":"2023"}],"event":{"name":"2025 IEEE International Test Conference in Asia (ITC-Asia)","location":"Tokyo, Japan","start":{"date-parts":[[2025,12,16]]},"end":{"date-parts":[[2025,12,19]]}},"container-title":["2025 IEEE International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11398837\/11399245\/11399434.pdf?arnumber=11399434","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T07:36:25Z","timestamp":1772004985000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11399434\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12,16]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/itc-asia67627.2025.00016","relation":{},"subject":[],"published":{"date-parts":[[2025,12,16]]}}}