{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T08:13:33Z","timestamp":1772007213404,"version":"3.50.1"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,12,16]],"date-time":"2025-12-16T00:00:00Z","timestamp":1765843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,16]],"date-time":"2025-12-16T00:00:00Z","timestamp":1765843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,12,16]]},"DOI":"10.1109\/itc-asia67627.2025.00017","type":"proceedings-article","created":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T20:56:07Z","timestamp":1771966567000},"page":"48-53","source":"Crossref","is-referenced-by-count":0,"title":["Design for Testability for VLSI Circuits with A Large Number of Unknown Test Response Sources"],"prefix":"10.1109","author":[{"given":"Dong","family":"Xiang","sequence":"first","affiliation":[{"name":"Tsinghua University,School of Software,Beijing,China,100084"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenfei","family":"Wang","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Software,Beijing,China,100084"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Can","family":"Xiang","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Software,Beijing,China,100084"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1244945"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147183"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.543772"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242035"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584077"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035350"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676174"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.256936"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2801847"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2210422"},{"key":"ref11","first-page":"237","article-title":"LFSR-coded test patterns for scan designs","volume-title":"Proc. of Euro. Test Conf.","author":"Koenemann"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2681063"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44778.2020.9325266"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3261781"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197640"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012631"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2181847"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"},{"key":"ref20","first-page":"83","article-title":"Testing computer hardware through data compression in space and time","volume-title":"Proc. of IEEE Intl. Test Conf.","author":"Saluja"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584076"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387356"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837366"},{"key":"ref24","first-page":"744","article-title":"Cost-effective scan design with non-scan test application cost and test power","volume-title":"Proc. of ACM\/IEEE Design Automation Conference","author":"Xiang"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2018775"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2159542.2159550"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3597433"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2474365"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1002"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2459035"}],"event":{"name":"2025 IEEE International Test Conference in Asia (ITC-Asia)","location":"Tokyo, Japan","start":{"date-parts":[[2025,12,16]]},"end":{"date-parts":[[2025,12,19]]}},"container-title":["2025 IEEE International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11398837\/11399245\/11399445.pdf?arnumber=11399445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T07:25:33Z","timestamp":1772004333000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11399445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12,16]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/itc-asia67627.2025.00017","relation":{},"subject":[],"published":{"date-parts":[[2025,12,16]]}}}