{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T08:09:44Z","timestamp":1772006984704,"version":"3.50.1"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,12,16]],"date-time":"2025-12-16T00:00:00Z","timestamp":1765843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,16]],"date-time":"2025-12-16T00:00:00Z","timestamp":1765843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004721","name":"University of Tokyo","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004721","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100006422","name":"Cadence Design Systems","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006422","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,12,16]]},"DOI":"10.1109\/itc-asia67627.2025.00023","type":"proceedings-article","created":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T20:56:07Z","timestamp":1771966567000},"page":"84-89","source":"Crossref","is-referenced-by-count":0,"title":["Test Point Insertion for an Approximate Multiplier Using Enhanced Static Segment Method to Reduce Test Patterns and Overdetection"],"prefix":"10.1109","author":[{"given":"Takuya","family":"Kishimoto","sequence":"first","affiliation":[{"name":"Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan"}]},{"given":"Hiroyuki","family":"Yotsuyanagi","sequence":"additional","affiliation":[{"name":"Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2015.2505723"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3006451"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2333366"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2772874"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131557"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2217962"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2643639"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC53507.2021.9613872"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/iSES52644.2021.00046"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.2999613"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474122"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927003"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia53059.2021.9808704"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2179036"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia58802.2023.10301158"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-CSCC62988.2024.10628389"}],"event":{"name":"2025 IEEE International Test Conference in Asia (ITC-Asia)","location":"Tokyo, Japan","start":{"date-parts":[[2025,12,16]]},"end":{"date-parts":[[2025,12,19]]}},"container-title":["2025 IEEE International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11398837\/11399245\/11399430.pdf?arnumber=11399430","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T07:18:06Z","timestamp":1772003886000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11399430\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12,16]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/itc-asia67627.2025.00023","relation":{},"subject":[],"published":{"date-parts":[[2025,12,16]]}}}