{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:29:36Z","timestamp":1781886576554,"version":"3.54.5"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/itc44170.2019.9000115","type":"proceedings-article","created":{"date-parts":[[2020,2,18]],"date-time":"2020-02-18T06:14:42Z","timestamp":1582006482000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Optimized Physical DFT Synthesis of Unified Compression and LBIST for Automotive Applications"],"prefix":"10.1109","author":[{"given":"Christos","family":"Papameletis","sequence":"first","affiliation":[{"name":"Modus DFT Software R&D Group, Cadence Design Systems,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Vivek","family":"Chickermane","sequence":"additional","affiliation":[{"name":"Modus DFT Software R&D Group, Cadence Design Systems,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Brian","family":"Foutz","sequence":"additional","affiliation":[{"name":"Modus DFT Software R&D Group, Cadence Design Systems,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sarthak","family":"Singhal","sequence":"additional","affiliation":[{"name":"Modus DFT Software R&D Group, Cadence Design Systems,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Krishna","family":"Chakravadhanula","sequence":"additional","affiliation":[{"name":"Modus DFT Software R&D Group, Cadence Design Systems,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Product How To: DFT strategy for ARM processor-based designs","author":"allsup","year":"2013","journal-title":"EDN Magazine"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041831"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651897"},{"key":"ref13","year":"2015","journal-title":"A Method for Physically Efficient Construction of VLSI Test Compression Logic"},{"key":"ref14","year":"2015","journal-title":"A Method for Physically Efficient Construction of VLSI Test Compression Logic"},{"key":"ref15","article-title":"Addressing Physical Challenges Early in RTL Synthesis","author":"sood","year":"2013","journal-title":"Cadence Front-End Design Summit"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242035"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2011.41"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386981"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035294"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651898"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035292"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569350"}],"event":{"name":"2019 IEEE International Test Conference (ITC)","location":"Washington, DC, USA","start":{"date-parts":[[2019,11,9]]},"end":{"date-parts":[[2019,11,15]]}},"container-title":["2019 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8977396\/9000108\/09000115.pdf?arnumber=9000115","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:25:37Z","timestamp":1756754737000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9000115\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/itc44170.2019.9000115","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}