{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,26]],"date-time":"2025-08-26T00:16:34Z","timestamp":1756167394762,"version":"3.44.0"},"reference-count":2,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/itc44170.2019.9000126","type":"proceedings-article","created":{"date-parts":[[2020,2,18]],"date-time":"2020-02-18T06:14:42Z","timestamp":1582006482000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion"],"prefix":"10.1109","author":[{"given":"Kosuke","family":"Ikeda","sequence":"first","affiliation":[{"name":"Advantest Japan, Applied Research and Technology Japan,Tokyo,Japan"}]},{"given":"Keith","family":"Schaub","sequence":"additional","affiliation":[{"name":"Advantest America, Inc., Applied Research and Technology,Austin,TX"}]},{"given":"Ira","family":"Leventhal","sequence":"additional","affiliation":[{"name":"Advantest America, Inc., Applied Research and Technology,Austin,TX"}]},{"given":"Yiorgos","family":"Makris","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas,Computer Science Dept.,Dallas,TX"}]},{"given":"Constantinos","family":"Xanthopoulos","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas,Computer Science Dept.,Dallas,TX"}]},{"given":"Deepika","family":"Neethirajan","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas,Computer Science Dept.,Dallas,TX"}]}],"member":"263","reference":[{"key":"ref2","article-title":"Unsupervised anomaly detection with generative adversarialnetworks to guide marker discovery","author":"schlegl","year":"2017","journal-title":"IPMI"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLA.2018.00201"}],"event":{"name":"2019 IEEE International Test Conference (ITC)","start":{"date-parts":[[2019,11,9]]},"location":"Washington, DC, USA","end":{"date-parts":[[2019,11,15]]}},"container-title":["2019 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8977396\/9000108\/09000126.pdf?arnumber=9000126","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,25]],"date-time":"2025-08-25T20:39:00Z","timestamp":1756154340000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9000126\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/itc44170.2019.9000126","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}