{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T00:04:01Z","timestamp":1756771441586,"version":"3.44.0"},"reference-count":39,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/itc44170.2019.9000133","type":"proceedings-article","created":{"date-parts":[[2020,2,18]],"date-time":"2020-02-18T06:14:42Z","timestamp":1582006482000},"page":"1-10","source":"Crossref","is-referenced-by-count":11,"title":["Test Time and Area Optimized BrST Scheme for Automotive ICs"],"prefix":"10.1109","author":[{"given":"Nilanjan","family":"Mukherjee","sequence":"first","affiliation":[{"name":"A Siemens Business,Wilsonville,OR,USA,97070"}]},{"given":"Daniel","family":"Tille","sequence":"additional","affiliation":[{"name":"Infineon Technologies,Neubiberg,Germany,85579"}]},{"given":"Mahendar","family":"Sapati","sequence":"additional","affiliation":[{"name":"Infineon Technologies,Neubiberg,Germany,85579"}]},{"given":"Yingdi","family":"Liu","sequence":"additional","affiliation":[{"name":"A Siemens Business,Wilsonville,OR,USA,97070"}]},{"given":"Jeffrey","family":"Mayer","sequence":"additional","affiliation":[{"name":"A Siemens Business,Wilsonville,OR,USA,97070"}]},{"given":"Sylwester","family":"Milewski","sequence":"additional","affiliation":[{"name":"Poznań University of Technology,Poznań,Poland,60-965"}]},{"given":"Elham","family":"Moghaddam","sequence":"additional","affiliation":[{"name":"A Siemens Business,Wilsonville,OR,USA,97070"}]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[{"name":"A Siemens Business,Wilsonville,OR,USA,97070"}]},{"given":"J\u0119drzej","family":"Solecki","sequence":"additional","affiliation":[{"name":"A Siemens Business,Wilsonville,OR,USA,97070"}]},{"given":"Jerzy","family":"Tyszer","sequence":"additional","affiliation":[{"name":"Poznań University of Technology,Poznań,Poland,60-965"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805828"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2002.1181727"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/43.918212"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512668"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557122"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1988.14726"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2606248"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569803"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/43.55187"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266205"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837985"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810763"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2002.996747"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/43.511581"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.21818"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2013.45"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831593"},{"key":"ref17","first-page":"894","article-title":"Two-dimensional test data compression for scan-based deterministic BIST","author":"liang","year":"0","journal-title":"Proc ITC"},{"key":"ref18","article-title":"Stag-gered ATPG with capture-per-cycle observation test points","author":"liu","year":"0","journal-title":"Proc VTS paper 6A-3"},{"key":"ref19","article-title":"The price tag of automotive electronics: What's really at play?","author":"mathas","year":"2017","journal-title":"EDN Network"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.260953"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.136"},{"key":"ref27","first-page":"253","article-title":"Test point insertion for scan-based BIST","author":"seiss","year":"0","journal-title":"Proc ETC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528044"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585245"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20020158"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041754"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894274"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437611"},{"key":"ref2","first-page":"506","article-title":"Timing-driven test point insertion for full-scan and partial-scan BIST","author":"cheng","year":"0","journal-title":"Proc ITC"},{"key":"ref9","article-title":"Understanding ISO 26262 ASILs","author":"hobbs","year":"2013","journal-title":"Electronic Design"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2717844"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242036"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2608984"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805826"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1997.643983"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114081"},{"key":"ref26","first-page":"104","article-title":"Virtual compression through test vector stitching for scan based designs","author":"rao","year":"0","journal-title":"Proc DATE"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"}],"event":{"name":"2019 IEEE International Test Conference (ITC)","start":{"date-parts":[[2019,11,9]]},"location":"Washington, DC, USA","end":{"date-parts":[[2019,11,15]]}},"container-title":["2019 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8977396\/9000108\/09000133.pdf?arnumber=9000133","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:25:37Z","timestamp":1756754737000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9000133\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/itc44170.2019.9000133","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}