{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,12]],"date-time":"2025-09-12T19:19:58Z","timestamp":1757704798939,"version":"3.41.2"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/itc44170.2019.9000171","type":"proceedings-article","created":{"date-parts":[[2020,2,18]],"date-time":"2020-02-18T06:14:42Z","timestamp":1582006482000},"page":"1-10","source":"Crossref","is-referenced-by-count":12,"title":["An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test"],"prefix":"10.1109","author":[{"given":"Seyed Nima","family":"Mozaffari","sequence":"first","affiliation":[{"name":"NVIDIA Corporation,Santa Clara,USA"}]},{"given":"Bonita","family":"Bhaskaran","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation,Santa Clara,USA"}]},{"given":"Kaushik","family":"Narayanun","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation,Santa Clara,USA"}]},{"given":"Ayub","family":"Abdollahian","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation,Santa Clara,USA"}]},{"given":"Vinod","family":"Pagalone","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation,Santa Clara,USA"}]},{"given":"Shantanu","family":"Sarangi","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation,Santa Clara,USA"}]},{"given":"Jonathon E.","family":"Colburn","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation,Santa Clara,USA"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2016.0032"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3240765.3240823"},{"key":"ref12","article-title":"A Clock-gating Based Capture Power Droop Reduction Methodology for At-Speed Scan Testing","author":"yang","year":"0","journal-title":"Design Automation and Test in Europe Conference and Exhibition (DATE)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477310"},{"journal-title":"Deep unordered composition rivals syntactic methods for text classification","year":"0","key":"ref14"},{"journal-title":"Matrix Computations","year":"1996","author":"golub","key":"ref15"},{"key":"ref16","article-title":"Rectified linear units improve restricted boltzmann machines","author":"nair","year":"0","journal-title":"The 27th Int Conf Mach Learning"},{"journal-title":"Pattern Recognition and Machine Learning","year":"2006","author":"bishop","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"},{"key":"ref19","article-title":"In-System-Test (IST) Architecture for NVIDIA Drive AGX Platforms","author":"jagannadha","year":"0","journal-title":"VLSI Test Symposium (VTS)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378488"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139132"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2013.6548903"},{"key":"ref5","article-title":"Lessons from At-Speed Scan Deployment on an Intel Itanium Microprocessor","author":"pant","year":"0","journal-title":"IEEE International Test Conference (ITC)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2474392"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231101"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.46"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.65"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2017.8244464"},{"key":"ref20","article-title":"Advanced Test Methodology for Complex SoCs","author":"jagannadha","year":"0","journal-title":"International Test Conference (ITC)"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758676"},{"key":"ref21","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"0","journal-title":"Proceedings of International Conference on Learning Representations"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966687"}],"event":{"name":"2019 IEEE International Test Conference (ITC)","start":{"date-parts":[[2019,11,9]]},"location":"Washington, DC, USA","end":{"date-parts":[[2019,11,15]]}},"container-title":["2019 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8977396\/9000108\/09000171.pdf?arnumber=9000171","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,28]],"date-time":"2025-07-28T19:42:38Z","timestamp":1753731758000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9000171\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/itc44170.2019.9000171","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}