{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:48:42Z","timestamp":1725587322981},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325214","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T21:17:10Z","timestamp":1611177430000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["Knowledge Transfer for Diagnosis Outcome Preview with Limited Data"],"prefix":"10.1109","author":[{"given":"Qicheng","family":"Huang","sequence":"first","affiliation":[{"name":"Carnegie Mellon University,Advanced Chip Testing Laboratory,Department of Electrical and Computer Engineering,Pittsburgh,PA,15213"}]},{"given":"Chenlei","family":"Fang","sequence":"additional","affiliation":[{"name":"Carnegie Mellon University,Advanced Chip Testing Laboratory,Department of Electrical and Computer Engineering,Pittsburgh,PA,15213"}]},{"given":"R. D. Shawn","family":"Blanton","sequence":"additional","affiliation":[{"name":"Carnegie Mellon University,Advanced Chip Testing Laboratory,Department of Electrical and Computer Engineering,Pittsburgh,PA,15213"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TPAMI.2016.2618118"},{"key":"ref11","first-page":"3140","article-title":"Mondrian forests: Efficient online random forests","author":"lakshminarayanan","year":"2014","journal-title":"Advances in neural information processing systems"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1145\/956750.956821"},{"key":"ref13","first-page":"726","article-title":"Transfer learning in decision trees","author":"won lee","year":"2007","journal-title":"2007 International Joint Conference on Neural Networks"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/ISIT.2004.1365067"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/VTS.2019.8758642"},{"key":"ref3","article-title":"Improving Diagnostic Efficiency via Machine Learning","author":"huang","year":"2018","journal-title":"International Test Conference"},{"year":"0","journal-title":"Out-of-bag error","key":"ref6"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1145\/3398267"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1145\/2593069.2593099"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TCAD.2016.2613927"},{"key":"ref2","article-title":"Improving Diagnostic Resolution of Failing ICs through Learning","author":"xue","year":"2016","journal-title":"Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TEST.2013.6651899"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1145\/2744769.2744832"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","start":{"date-parts":[[2020,11,1]]},"location":"Washington, DC, USA","end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325214.pdf?arnumber=9325214","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:58:11Z","timestamp":1656453491000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325214\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325214","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}