{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:04:55Z","timestamp":1740099895642,"version":"3.37.3"},"reference-count":34,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325229","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T21:17:10Z","timestamp":1611177430000},"page":"1-10","source":"Crossref","is-referenced-by-count":2,"title":["Concurrent Error Detection in Embedded Digital Control of Nonlinear Autonomous Systems Using Adaptive State Space Checks"],"prefix":"10.1109","author":[{"given":"Md Imran","family":"Momtaz","sequence":"first","affiliation":[]},{"given":"Chandramouli N","family":"Amarnath","sequence":"additional","affiliation":[]},{"given":"Abhijit","family":"Chatterjee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2258296"},{"journal-title":"Quadrotor control modeling nonlinear control design and simulation","year":"2015","author":"sabatino","key":"ref32"},{"journal-title":"Crazyflie 2 1","year":"0","key":"ref31"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ATS47505.2019.00026"},{"journal-title":"Development of a driver vehicle module (dvm) for the interactive highway safety design model (ihsdm)","year":"2007","author":"levison","key":"ref34"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2018.00065"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/7.670327"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CCA.1998.728424"},{"key":"ref13","first-page":"1","article-title":"On-line diagnosis and compensation for parametric failures in linear state variable circuits and systems using time-domain checksum observers","author":"momtaz","year":"2017","journal-title":"VLSI Test Symposium (VTS) 2017 IEEE 35th"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2019.8854392"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2016.7604691"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS50870.2020.9159724"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676475"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1986.13535"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/12.54836"},{"journal-title":"Contributions to the Theory of Optimal Control","year":"1960","author":"kalman","key":"ref28"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1541880.1541882"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855962"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2019.2903049"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASCC.2017.8287208"},{"key":"ref29","article-title":"Testing statistical hypotheses","author":"lehmann","year":"2005","journal-title":"Springer Texts in Statistics"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2009.2037498"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.2000.846370"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACTEA.2009.5227853"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-85729-085-4"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IDC.2007.374555"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jengtecman.2018.04.006"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/12.237720"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474159"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/92.238422"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2004.839247"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805861"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046233"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477298"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","start":{"date-parts":[[2020,11,1]]},"location":"Washington, DC, USA","end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325229.pdf?arnumber=9325229","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:58:11Z","timestamp":1656453491000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325229\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325229","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}