{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T16:29:13Z","timestamp":1725726553523},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325242","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T21:17:10Z","timestamp":1611177430000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications"],"prefix":"10.1109","author":[{"given":"Gabriele","family":"Boschi","sequence":"first","affiliation":[]},{"given":"Elisa","family":"Spano","sequence":"additional","affiliation":[]},{"given":"Hayk","family":"Grigoryan","sequence":"additional","affiliation":[]},{"given":"Arun","family":"Kumar","sequence":"additional","affiliation":[]},{"given":"Gurgen","family":"Harutyunyan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/24.52622"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.98"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046237"},{"journal-title":"White Paper","article-title":"Soft errors in electronic memory","year":"2004","key":"ref14"},{"key":"ref15","first-page":"275","article-title":"A Memory Soft Error Measurement on Production Systems","author":"li","year":"2007","journal-title":"Proceedings of the USENIX Annual Technical Conference"},{"key":"ref4","article-title":"Workload Consolidation in Industrial IoT","author":"dadwal","year":"2019","journal-title":"Intel"},{"journal-title":"Safety of Machinery—Safety-Related Parts of Control Systems—Part 1 General Principles for Design","article-title":"ISO 13849-1:2015","year":"0","key":"ref3"},{"journal-title":"IEC 61508-1 2015 Table\ufffd3","year":"0","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3182\/20140824-6-ZA-1003.02004"},{"journal-title":"Failure Rate Modelling for Reliability and Risk","year":"2008","author":"finkelstein","key":"ref8"},{"key":"ref7","article-title":"Test Challenges in a Chiplet Marketplace","author":"hutner","year":"2020","journal-title":"IEEE VLSI Test Symposium (VTS)"},{"journal-title":"IEC 61508 Functional Safety of Electrical\/electronic\/programmable Electronic Safety-related Systems","year":"0","key":"ref2"},{"journal-title":"ISO\/FDIS 26262 Road vehicles – Functional safety","year":"0","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197722"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","start":{"date-parts":[[2020,11,1]]},"location":"Washington, DC, USA","end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325242.pdf?arnumber=9325242","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:51:20Z","timestamp":1656453080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325242\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325242","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}