{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,6]],"date-time":"2026-07-06T10:44:32Z","timestamp":1783334672560,"version":"3.54.6"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325250","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T21:17:10Z","timestamp":1611177430000},"page":"1-5","source":"Crossref","is-referenced-by-count":20,"title":["Machine Intelligence for Efficient Test Pattern Generation"],"prefix":"10.1109","author":[{"given":"Soham","family":"Roy","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Spencer K.","family":"Millican","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Vishwani D.","family":"Agrawal","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2019.00054"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ATS47505.2019.000-7"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699272"},{"key":"ref13","first-page":"221","article-title":"On Testability Analysis of Combinational Circuits","author":"brglez","year":"1984","journal-title":"Proc Int Symp Circuits and Systems"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0893-6080(97)00111-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/b117406"},{"key":"ref16","article-title":"Adam: A Method for Stochastic Optimization","author":"kingma","year":"2014","journal-title":"arXiv preprint arXiv 1412 6980"},{"key":"ref17","first-page":"677","article-title":"A Neutral Netlist of 10 Combinational Benchmark Circuits and a Targeted Translator in FORTRAN","author":"brglez","year":"1985","journal-title":"Proceedings of the IEEE Int Symposium on Circuits and Systems (ISCAS)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084687"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675757"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/18.6031"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-3958-2"},{"key":"ref5","author":"roth","year":"0","journal-title":"Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.46"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287692"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1982.1676041"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1975.224205"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317838"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676174"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/43.3140"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","location":"Washington, DC, USA","start":{"date-parts":[[2020,11,1]]},"end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325250.pdf?arnumber=9325250","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:51:21Z","timestamp":1656453081000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325250\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325250","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}