{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T21:07:57Z","timestamp":1725656877041},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325251","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T21:17:10Z","timestamp":1611177430000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces"],"prefix":"10.1109","author":[{"given":"Haiying","family":"Ma","sequence":"first","affiliation":[]},{"given":"Ligang","family":"Lu","sequence":"additional","affiliation":[]},{"given":"Haitao","family":"Qian","sequence":"additional","affiliation":[]},{"given":"Jing","family":"Han","sequence":"additional","affiliation":[]},{"given":"Xin","family":"Wen","sequence":"additional","affiliation":[]},{"given":"Fanjin","family":"Meng","sequence":"additional","affiliation":[]},{"given":"Rahul","family":"Singhal","sequence":"additional","affiliation":[]},{"given":"Martin","family":"Keim","sequence":"additional","affiliation":[]},{"given":"Yu","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Wu","family":"Yang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia.2019.00024"},{"journal-title":"IEEE 1500-2005 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits","year":"0","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041899"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia.2019.00024"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670842"},{"journal-title":"IEEE 1687-2014 - IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device","year":"0","key":"ref2"},{"key":"ref1","article-title":"AI Chip DFT Techniques for Aggressive Time-to-Market","author":"singhal","year":"0","journal-title":"White Paper"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","start":{"date-parts":[[2020,11,1]]},"location":"Washington, DC, USA","end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325251.pdf?arnumber=9325251","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:51:20Z","timestamp":1656453080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325251\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325251","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}