{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T16:40:45Z","timestamp":1776530445706,"version":"3.51.2"},"reference-count":29,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325252","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T16:17:10Z","timestamp":1611159430000},"page":"1-9","source":"Crossref","is-referenced-by-count":11,"title":["Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients"],"prefix":"10.1109","author":[{"given":"Rafael B.","family":"Schvittz","sequence":"first","affiliation":[]},{"given":"Paulo F.","family":"Butzen","sequence":"additional","affiliation":[]},{"given":"Leomar S. da","family":"Rosa","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Meitodo para o cailculo da confiabilidade de portas logicas na presença de falhas stuck-on e stuck-open","author":"schvittz","year":"2017","journal-title":"Mestrado em Engenharia de Computacao Universidade Federal do Rio Grande - FURG Rio Grande"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2018.8617918"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2019.8920333"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-5646-8"},{"key":"ref14","author":"friedberg","year":"2011","journal-title":"Ionizing Radiation in Earth’s Atmosphere and in Space Near Earth"},{"key":"ref15","author":"gomes","year":"2018","journal-title":"Use of approximate triple modular redundancy for fault tolerance in digital circuits"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-5646-8_1"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6993-4_2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.855826"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813137"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113871"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3299874.3317978"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1142\/9789812794703_0001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2016206"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2018.8617852"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.23"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2008.4674942"},{"key":"ref7","first-page":"59","article-title":"Evaluating circuit reliability under probabilistic gate-level fault models","author":"patel","year":"2003","journal-title":"Proceedings of the International Workshop on Logic and Synthesis"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2009.5290448"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.Design.2010.85"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2042613"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255624"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.069"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2003.1214376"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.dam.2004.03.003"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584062"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","location":"Washington, DC, USA","start":{"date-parts":[[2020,11,1]]},"end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325252.pdf?arnumber=9325252","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:58:11Z","timestamp":1656439091000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325252\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325252","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}