{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:44:00Z","timestamp":1749620640569,"version":"3.37.3"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325256","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T21:17:10Z","timestamp":1611177430000},"page":"1-10","source":"Crossref","is-referenced-by-count":5,"title":["Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections"],"prefix":"10.1109","author":[{"given":"Muslum Emir","family":"Avci","sequence":"first","affiliation":[]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2019.2899054"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/WISNET.2018.8311569"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/19.571902"},{"key":"ref13","first-page":"703","article-title":"A fully inp monolithic integrated millimeter-wave reflectometer","author":"lasri","year":"2006","journal-title":"2006 European Microwave Conference"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/22.643853"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1985.4315301"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.1973.1140527"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1977.1129278"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"137","DOI":"10.1049\/ip-map:19960270","article-title":"novel nine-port network analyser for measuring scattering coefficients of two-port devices","volume":"143","author":"yeo","year":"1996","journal-title":"Microwaves Antennas and Propagation IEE Proceedings -"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1977.1129276"},{"journal-title":"Awr1243 cascade application report","year":"0","author":"kumar","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310232"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2015.7138762"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2018.8461847"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2506547"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342414"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624893"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.119"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477284"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1977.1129277"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2018.8429026"},{"journal-title":"Calibrating a six-port r eflectometer with four impedance standards","year":"1979","author":"hoer","key":"ref21"},{"journal-title":"scipy optimize minimize","year":"0","key":"ref23"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","start":{"date-parts":[[2020,11,1]]},"location":"Washington, DC, USA","end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325256.pdf?arnumber=9325256","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:58:11Z","timestamp":1656453491000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325256\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325256","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}