{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T15:41:30Z","timestamp":1725810090233},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325260","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T21:17:10Z","timestamp":1611177430000},"page":"1-5","source":"Crossref","is-referenced-by-count":6,"title":["New Perspectives on Core In-field Path Delay Test"],"prefix":"10.1109","author":[{"given":"Riccardo","family":"Cantoro","sequence":"first","affiliation":[]},{"given":"Dario","family":"Foti","sequence":"additional","affiliation":[]},{"given":"Sandro","family":"Sartoni","sequence":"additional","affiliation":[]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[]},{"given":"Lorena","family":"Anghel","sequence":"additional","affiliation":[]},{"given":"Michele","family":"Portolan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.23919\/DATE.2018.8342154"},{"key":"ref11","first-page":"1080","article-title":"Test program synthesis for path delay faults in microprocessor cores","author":"lai","year":"2000","journal-title":"IEEE International Test Conference"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/ETS.2007.28"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/VTS.2008.37"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/VLSID.2017.58"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/VTS.2005.59"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TVLSI.2006.886412"},{"key":"ref17","first-page":"1","article-title":"Identification of testable representative paths for lowcost verification of circuit performance during manufacturing and in-field tests","author":"chen","year":"2014","journal-title":"IEEE 32nd VLSI Test Symposium (VTS)"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TC.2015.2498546"},{"year":"0","journal-title":"ETH Zurich and University of Bologna","key":"ref19"},{"year":"0","key":"ref4"},{"year":"0","key":"ref3"},{"year":"0","key":"ref6"},{"year":"0","key":"ref5"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/VTS.2019.8758662"},{"year":"0","key":"ref7"},{"year":"0","key":"ref2"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/MDT.2010.5"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TC.2016.2622688"},{"year":"0","key":"ref20"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/DAC.2006.229261"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/DATE.2012.6176506"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TVLSI.2010.2099243"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","start":{"date-parts":[[2020,11,1]]},"location":"Washington, DC, USA","end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325260.pdf?arnumber=9325260","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:51:20Z","timestamp":1656453080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325260\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325260","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}